FIN, Alessandro
 Distribuzione geografica
Continente #
NA - Nord America 1.051
EU - Europa 807
AS - Asia 269
SA - Sud America 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 2.130
Nazione #
US - Stati Uniti d'America 1.047
GB - Regno Unito 275
CN - Cina 170
SE - Svezia 127
SG - Singapore 93
FI - Finlandia 74
DE - Germania 65
FR - Francia 63
IE - Irlanda 62
RU - Federazione Russa 62
IT - Italia 30
UA - Ucraina 28
BE - Belgio 4
CA - Canada 4
CZ - Repubblica Ceca 3
AT - Austria 2
BG - Bulgaria 2
EE - Estonia 2
HK - Hong Kong 2
NL - Olanda 2
TR - Turchia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
BR - Brasile 1
CL - Cile 1
DK - Danimarca 1
ES - Italia 1
HR - Croazia 1
HU - Ungheria 1
ID - Indonesia 1
LK - Sri Lanka 1
RO - Romania 1
RS - Serbia 1
Totale 2.130
Città #
Southend 255
Jacksonville 242
Chandler 237
Woodbridge 138
Ann Arbor 121
Singapore 78
Dublin 62
Houston 40
Ashburn 38
Nanjing 26
Lawrence 25
Princeton 25
Helsinki 24
Sindelfingen 24
Wilmington 21
Boardman 15
Jinan 15
Shenyang 13
Milan 12
Guangzhou 11
Hebei 11
Beijing 10
Nanchang 10
Tianjin 9
Santa Clara 7
Verona 7
Zhengzhou 7
Ningbo 6
Changsha 5
Jiaxing 5
New York 5
Brussels 4
Moscow 4
Taiyuan 4
Hangzhou 3
Prague 3
San Diego 3
Edinburgh 2
Haikou 2
Norwalk 2
Sofia 2
Stockholm 2
Tallinn 2
Vicolungo 2
Vienna 2
Washington 2
Amsterdam 1
Atlanta 1
Belgrade 1
Budapest 1
Clearwater 1
Copenhagen 1
Dambulla 1
Fairfield 1
Frankfurt am Main 1
Kemerovo 1
Lancaster 1
Los Angeles 1
Medina 1
Montreal 1
Naples 1
Oklahoma City 1
Ottawa 1
Phoenix 1
Reston 1
Romola 1
San Francisco 1
San Giorgio A Cremano 1
Seattle 1
Tappahannock 1
Toronto 1
Vancouver 1
Zagreb 1
Totale 1.570
Nome #
A 1000X Speed Up for Properties Completeness Evaluation 129
A WEB-CAD Methodology for IP-Core Analysis and Simulation 105
On the Reuse of VHDL Modules into SystemC Design 102
An Application of Genetic Algorithms and BDDs to Functional Testing 100
SystemC: A Homogenous Environment to Test Embedded Systems 97
A VHDL Error Simulator for Functional Test Generation 92
Mixing ATPG and Property Checking for Testing HW/SW Interfaces 91
A SystemC-based Framework for Properties Incompleteness Evaluation 90
AMLETO: A Multi-language Environment for Functional Test Generation 87
Genetic Algorithms: the Philosopher’s Stone or an Effective Solution for High-Level TPG? 86
BIST Architectures Selection Based on Behavioral Testing 85
On SAT-applicability to High-Level Testing 85
A Protected IP-Core Test Generation 84
Behavioral Test Generation for the Selection of BIST Logic 83
SystemC as a Complete Design and Validation Environment 82
Emulation-based Design Errors Identification 82
The Use of SystemC for Design Verification and Integration Test of IP-Cores 79
Soft-Cores Generation by Instruction Set Analysis 77
A Fault Tolerant Incremental Design Methodology 77
A Genetic Testing Framework for Digital Integrated Circuits 76
Functional Test Generation: Overview and Proposal of a Hybrid Genetic Approach 76
Laerte++: an Object Oriented High-Level TPG for SystemC Designs 74
Functional Test Generation for Behaviorally Sequential Models 74
LAERTE++: An Object Oriented High-Level TPG for SystemC Designs 74
A Remote Methodology for Embedded Systems Design and Validation 71
Totale 2.158
Categoria #
all - tutte 7.849
article - articoli 557
book - libri 0
conference - conferenze 6.559
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 733
Totale 15.698


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020171 0 0 0 0 21 48 7 24 14 26 1 30
2020/2021226 6 34 7 28 17 42 2 23 23 5 32 7
2021/2022258 17 88 0 25 33 3 2 11 4 7 17 51
2022/2023537 37 80 55 99 40 108 1 38 49 10 18 2
2023/2024179 13 10 27 53 13 9 6 16 0 2 16 14
2024/2025185 36 56 4 82 7 0 0 0 0 0 0 0
Totale 2.158