CATALOGO DEI PRODOTTI DELLA RICERCA

FIN, Alessandro
 Distribuzione geografica
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Continente #
NA - Nord America 1.024
EU - Europa 744
AS - Asia 149
SA - Sud America 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 1.920
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Nazione #
US - Stati Uniti d'America 1.020
GB - Regno Unito 275
CN - Cina 143
SE - Svezia 127
FI - Finlandia 72
DE - Germania 65
FR - Francia 63
IE - Irlanda 62
IT - Italia 29
UA - Ucraina 28
BE - Belgio 4
CA - Canada 4
CZ - Repubblica Ceca 3
AT - Austria 2
BG - Bulgaria 2
EE - Estonia 2
HK - Hong Kong 2
NL - Olanda 2
RU - Federazione Russa 2
TR - Turchia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
BR - Brasile 1
CL - Cile 1
DK - Danimarca 1
ES - Italia 1
HR - Croazia 1
HU - Ungheria 1
ID - Indonesia 1
LK - Sri Lanka 1
RO - Romania 1
RS - Serbia 1
Totale 1.920
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Città #
Southend 255
Jacksonville 242
Chandler 237
Woodbridge 138
Ann Arbor 121
Dublin 62
Houston 40
Ashburn 33
Nanjing 26
Lawrence 25
Princeton 25
Sindelfingen 24
Helsinki 22
Wilmington 21
Jinan 15
Boardman 14
Shenyang 13
Milan 12
Hebei 11
Beijing 10
Nanchang 10
Tianjin 9
Guangzhou 8
Verona 7
Zhengzhou 7
Ningbo 6
Changsha 5
Jiaxing 5
New York 5
Brussels 4
Taiyuan 4
Hangzhou 3
Prague 3
San Diego 3
Edinburgh 2
Haikou 2
Norwalk 2
Sofia 2
Stockholm 2
Tallinn 2
Vicolungo 2
Vienna 2
Washington 2
Amsterdam 1
Atlanta 1
Belgrade 1
Budapest 1
Clearwater 1
Copenhagen 1
Dambulla 1
Fairfield 1
Frankfurt am Main 1
Kemerovo 1
Lancaster 1
Medina 1
Montreal 1
Naples 1
Oklahoma City 1
Ottawa 1
Reston 1
San Francisco 1
San Giorgio A Cremano 1
Seattle 1
Tappahannock 1
Toronto 1
Vancouver 1
Zagreb 1
Totale 1.467
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Nome #
A 1000X Speed Up for Properties Completeness Evaluation 113
A WEB-CAD Methodology for IP-Core Analysis and Simulation 97
On the Reuse of VHDL Modules into SystemC Design 93
An Application of Genetic Algorithms and BDDs to Functional Testing 92
SystemC: A Homogenous Environment to Test Embedded Systems 89
A VHDL Error Simulator for Functional Test Generation 83
Mixing ATPG and Property Checking for Testing HW/SW Interfaces 82
A SystemC-based Framework for Properties Incompleteness Evaluation 80
AMLETO: A Multi-language Environment for Functional Test Generation 80
BIST Architectures Selection Based on Behavioral Testing 78
Behavioral Test Generation for the Selection of BIST Logic 77
A Protected IP-Core Test Generation 77
Genetic Algorithms: the Philosopher’s Stone or an Effective Solution for High-Level TPG? 77
SystemC as a Complete Design and Validation Environment 74
Emulation-based Design Errors Identification 74
On SAT-applicability to High-Level Testing 73
The Use of SystemC for Design Verification and Integration Test of IP-Cores 70
Soft-Cores Generation by Instruction Set Analysis 69
Functional Test Generation for Behaviorally Sequential Models 68
A Genetic Testing Framework for Digital Integrated Circuits 67
LAERTE++: An Object Oriented High-Level TPG for SystemC Designs 67
Functional Test Generation: Overview and Proposal of a Hybrid Genetic Approach 67
Laerte++: an Object Oriented High-Level TPG for SystemC Designs 65
A Remote Methodology for Embedded Systems Design and Validation 65
A Fault Tolerant Incremental Design Methodology 65
Totale 1.942
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Categoria #
all - tutte 5.935
article - articoli 426
book - libri 0
conference - conferenze 4.949
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 560
Totale 11.870
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/20193 0 0 0 0 0 0 0 0 0 0 0 3
2019/2020234 36 0 2 25 21 48 7 24 14 26 1 30
2020/2021226 6 34 7 28 17 42 2 23 23 5 32 7
2021/2022258 17 88 0 25 33 3 2 11 4 7 17 51
2022/2023537 37 80 55 99 40 108 1 38 49 10 18 2
2023/2024148 13 10 27 53 13 9 6 16 0 1 0 0
Totale 1.942