BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.

BIST Architectures Selection Based on Behavioral Testing

FIN, Alessandro;FUMMI, Franco;
2000-01-01

Abstract

BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.
2000
design for testability; BIST; behavioral testing
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11562/15461
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? 0
social impact