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EnglishBIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.
| Titolo: | BIST Architectures Selection Based on Behavioral Testing | |
| Autori: | ||
| Data di pubblicazione: | 2000 | |
| Abstract: | BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated. | |
| Handle: | http://hdl.handle.net/11562/15461 | |
| Appare nelle tipologie: | 04.01 Contributo in atti di convegno |
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