BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.

BIST Architectures Selection Based on Behavioral Testing

FIN, Alessandro;FUMMI, Franco;
2000

Abstract

BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.
design for testability; BIST; behavioral testing
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11562/15461
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