BIST Architectures Selection Based on Behavioral Testing

Biasoli, G.; Ferrandi, F.; Fin, Alessandro; Fummi, Franco; Sciuto, D.

doi:10.1109/DFTVS.2000.887169

BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.

Titolo:	BIST Architectures Selection Based on Behavioral Testing
Autori:	G. Biasoli F. Ferrandi FIN, Alessandro FUMMI, Franco D. Sciuto mostra contributor esterni nascondi contributor esterni
Data di pubblicazione:	2000
Abstract:	BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.
Handle:	http://hdl.handle.net/11562/15461
Appare nelle tipologie:	04.01 Contributo in atti di convegno

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