Thermal Quasi Reflectography (TQR), e.g. imaging in the thermal band 3-5 μm (MWIR), is discussed as innovative tool for the noninvasive analysis of pictorial surface layers in artworks, and its potential is demonstrated in some applications. The results encourage further developments in this field. The novel experimental technique, which has been recently introduced by the authors, is reviewed here giving focus to current research and potential applications.
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