A systematic study of Silicon nanocrystals (Si-ncs) nonlinearities at 1550nm was carried out in view of the realization of an all optical Mach-Zehender Interferometer (MZI).

Non linear optical properties of silicon nanocrystals for applications in photonic logic gates devices

Daldosso, Nicola;
2008

Abstract

A systematic study of Silicon nanocrystals (Si-ncs) nonlinearities at 1550nm was carried out in view of the realization of an all optical Mach-Zehender Interferometer (MZI).
Non linear optial properties; logic gate; silicon nanocrystals
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11562/477082
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