The paper describes, first, a technique to automatically generate extended finite state machines (EFSMs) and high-level decision diagrams (HLDDs) from HDL descriptions. Then, these two paradigms are exploited inside a functional test pattern generator. The goal is to combine the beneficial properties of the above paradigms using EFSMs for targeting control FSM transitions and variable-oriented HLDDs for targeting bit-coverage faults in the data variables, respectively. Experimental results show that combining the two computational models in a functional ATPG yields indeed in higher fault coverage.

Automatic generation of EFSMs and HLDDs for functional ATPG

DI GUGLIELMO, Giuseppe;FUMMI, Franco;PRAVADELLI, Graziano;
2008-01-01

Abstract

The paper describes, first, a technique to automatically generate extended finite state machines (EFSMs) and high-level decision diagrams (HLDDs) from HDL descriptions. Then, these two paradigms are exploited inside a functional test pattern generator. The goal is to combine the beneficial properties of the above paradigms using EFSMs for targeting control FSM transitions and variable-oriented HLDDs for targeting bit-coverage faults in the data variables, respectively. Experimental results show that combining the two computational models in a functional ATPG yields indeed in higher fault coverage.
9781424420599
Functional ATPG; EFSM; HLDD
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11562/323064
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