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EnglishThe paper describes, first, a technique to automatically generate extended finite state machines (EFSMs) and high-level decision diagrams (HLDDs) from HDL descriptions. Then, these two paradigms are exploited inside a functional test pattern generator. The goal is to combine the beneficial properties of the above paradigms using EFSMs for targeting control FSM transitions and variable-oriented HLDDs for targeting bit-coverage faults in the data variables, respectively. Experimental results show that combining the two computational models in a functional ATPG yields indeed in higher fault coverage.
| Titolo: | Automatic generation of EFSMs and HLDDs for functional ATPG |
| Autori: | |
| Data di pubblicazione: | 2008 |
| Abstract: | The paper describes, first, a technique to automatically generate extended finite state machines (EFSMs) and high-level decision diagrams (HLDDs) from HDL descriptions. Then, these two paradigms are exploited inside a functional test pattern generator. The goal is to combine the beneficial properties of the above paradigms using EFSMs for targeting control FSM transitions and variable-oriented HLDDs for targeting bit-coverage faults in the data variables, respectively. Experimental results show that combining the two computational models in a functional ATPG yields indeed in higher fault coverage. |
| Handle: | http://hdl.handle.net/11562/323064 |
| ISBN: | 9781424420599 |
| Appare nelle tipologie: | 04.01 Contributo in atti di convegno |
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