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EnglishThe paper describes a high-level pseudodeterministic ATPG that explores the DUT state space by exploiting an easy-to-traverse extended FSM model. Testing of hard-to-detect faults is thus improved. Generated test sequences are very effective in detecting both high-level faults and gate-level stuck-at faults. Thus, the reuse of test sequences generated by the proposed ATPG allows to improve the stuck-at fault coverage and to reduce the execution time of commercial gate-level ATPGs.
| Titolo: | Improving Gate-Level ATPG by Traversing Concurrent EFSMs |
| Autori: | |
| Data di pubblicazione: | 2006 |
| Abstract: | The paper describes a high-level pseudodeterministic ATPG that explores the DUT state space by exploiting an easy-to-traverse extended FSM model. Testing of hard-to-detect faults is thus improved. Generated test sequences are very effective in detecting both high-level faults and gate-level stuck-at faults. Thus, the reuse of test sequences generated by the proposed ATPG allows to improve the stuck-at fault coverage and to reduce the execution time of commercial gate-level ATPGs. |
| Handle: | http://hdl.handle.net/11562/28166 |
| ISBN: | 0769525148 |
| Appare nelle tipologie: | 04.01 Contributo in atti di convegno |
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