The paper describes a high-level pseudodeterministic ATPG that explores the DUT state space by exploiting an easy-to-traverse extended FSM model. Testing of hard-to-detect faults is thus improved. Generated test sequences are very effective in detecting both high-level faults and gate-level stuck-at faults. Thus, the reuse of test sequences generated by the proposed ATPG allows to improve the stuck-at fault coverage and to reduce the execution time of commercial gate-level ATPGs.

Improving Gate-Level ATPG by Traversing Concurrent EFSMs

DI GUGLIELMO, Giuseppe;FUMMI, Franco;MARCONCINI, Cristina;PRAVADELLI, Graziano
2006-01-01

Abstract

The paper describes a high-level pseudodeterministic ATPG that explores the DUT state space by exploiting an easy-to-traverse extended FSM model. Testing of hard-to-detect faults is thus improved. Generated test sequences are very effective in detecting both high-level faults and gate-level stuck-at faults. Thus, the reuse of test sequences generated by the proposed ATPG allows to improve the stuck-at fault coverage and to reduce the execution time of commercial gate-level ATPGs.
0769525148
Gate-level ATPG; EFSM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11562/28166
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