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EnglishIn this paper we present a novel approach for functional verification of programmable devices. The proposed methodology is suited to refine the results obtained by a functional automatic test pattern generator (ATPG). The hard-to-detect faults are examined by exploiting the controllability ability of a high-level ATPG in conjunction with the observability potentiality of software instructions targeted to the programmable device. Generated test programs can be used for both functional verification and at-speed testing.
| Titolo: | At-Speed Functional Verification of Programmable Devices |
| Autori: | |
| Data di pubblicazione: | 2004 |
| Abstract: | In this paper we present a novel approach for functional verification of programmable devices. The proposed methodology is suited to refine the results obtained by a functional automatic test pattern generator (ATPG). The hard-to-detect faults are examined by exploiting the controllability ability of a high-level ATPG in conjunction with the observability potentiality of software instructions targeted to the programmable device. Generated test programs can be used for both functional verification and at-speed testing. |
| Handle: | http://hdl.handle.net/11562/243145 |
| ISBN: | 0769522416 |
| Appare nelle tipologie: | 04.01 Contributo in atti di convegno |
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