In this paper we present a novel approach for functional verification of programmable devices. The proposed methodology is suited to refine the results obtained by a functional automatic test pattern generator (ATPG). The hard-to-detect faults are examined by exploiting the controllability ability of a high-level ATPG in conjunction with the observability potentiality of software instructions targeted to the programmable device. Generated test programs can be used for both functional verification and at-speed testing.

At-Speed Functional Verification of Programmable Devices

BOMBIERI, Nicola;FUMMI, Franco;PRAVADELLI, Graziano
2004

Abstract

In this paper we present a novel approach for functional verification of programmable devices. The proposed methodology is suited to refine the results obtained by a functional automatic test pattern generator (ATPG). The hard-to-detect faults are examined by exploiting the controllability ability of a high-level ATPG in conjunction with the observability potentiality of software instructions targeted to the programmable device. Generated test programs can be used for both functional verification and at-speed testing.
0769522416
Functional verification; RTL; device
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11562/243145
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