An EFSM-based Approach for Functional ATPG

This paper presents an EFSM-based approach for functional automatic test pattern generation (ATPG). It shows how a particular kind of extended FSM (EFSM) can be efficiently traversed by a pseudo-determinist ATPG to control and propagate faults for a functional description of a design. Functional ATPG on such EFSM models have been showed to be more efficient than the ATPG on the original design. However, test sequences generated on such an EFSM can lose their efficacy when simulated on the original description, since they may show some timing discrepancies. To solve this problem, this paper propose a strategy that manipulates the EFSM model.