Aim of this paper is the analysis of different functional fault models for multi-level implementations of sequential circuits. The relationships between functional and gate level fault coverage are fully discussed.
FSM Fault Models Impact on Test Performances
FUMMI, Franco
1993-01-01
Abstract
Aim of this paper is the analysis of different functional fault models for multi-level implementations of sequential circuits. The relationships between functional and gate level fault coverage are fully discussed.
File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
