The problem of testability and test pattern generation at the highest abstraction level, i.e., based on the network's behavior, is considered for Hopfield networks. Complete testability is proved. A test pattern generation approach based on creation of an equivalent finite state machine is presented, the functional test pattern generation have been proved to allow very high coverage of logic-level faults in the case of finite state machines. An efficient algorithm, using BDDs, is finally described.
Behavioral Testability and Test Pattern Generation of the Hopfield Network Model
FUMMI, Franco;
1994-01-01
Abstract
The problem of testability and test pattern generation at the highest abstraction level, i.e., based on the network's behavior, is considered for Hopfield networks. Complete testability is proved. A test pattern generation approach based on creation of an equivalent finite state machine is presented, the functional test pattern generation have been proved to allow very high coverage of logic-level faults in the case of finite state machines. An efficient algorithm, using BDDs, is finally described.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.