Testing of delay faults in sequential circuits is the main topic of this paper. The proposed testing methodology exploits at first the possibility of a functional approach, thus, some relationships between a functional fault model and the gate level delay fault model are illustrated. The cooperation between a combinational test pattern generator (TPG), working at the gate level, and a functional TPG is illustrated. Such a proposed test strategy achieves the full fault coverage, as shown with a set of benchmarks.
On the Detection of Delay Faults Starting from a Functional Description of a Sequential Circuit
FUMMI, Franco
1994-01-01
Abstract
Testing of delay faults in sequential circuits is the main topic of this paper. The proposed testing methodology exploits at first the possibility of a functional approach, thus, some relationships between a functional fault model and the gate level delay fault model are illustrated. The cooperation between a combinational test pattern generator (TPG), working at the gate level, and a functional TPG is illustrated. Such a proposed test strategy achieves the full fault coverage, as shown with a set of benchmarks.File in questo prodotto:
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