The aim of this paper is the presentation of a new methodology for fast test pattern generation for difficult faults. A BDD-based algorithm is applied as back-end of a standard ATPG (e.g. SOCRATES, FAN, PODEM) thus providing a solution to their inefficiency in difficult faults analysis. Experimental results show the effectiveness of the proposed approach on a number of benchmark circuits.
A BDD Based Algorithm for Detecting Difficult Faults
FUMMI, Franco;
1995-01-01
Abstract
The aim of this paper is the presentation of a new methodology for fast test pattern generation for difficult faults. A BDD-based algorithm is applied as back-end of a standard ATPG (e.g. SOCRATES, FAN, PODEM) thus providing a solution to their inefficiency in difficult faults analysis. Experimental results show the effectiveness of the proposed approach on a number of benchmark circuits.
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