Gate-level test pattern generators require insertion of scan paths to handle the flat gate-level representation of a large sequential controller. In contrast, we present a testing methodology based on the hierarchical finite state machine model. Such a model is used to specify very complex control devices by means of a top-down design approach. Our approach allows the generation of compact test sets with very high stuck-at fault coverages, without any DfT logic.

The Use of Hierarchical Information to Test Large Controllers

FUMMI, Franco;
1997

Abstract

Gate-level test pattern generators require insertion of scan paths to handle the flat gate-level representation of a large sequential controller. In contrast, we present a testing methodology based on the hierarchical finite state machine model. Such a model is used to specify very complex control devices by means of a top-down design approach. Our approach allows the generation of compact test sets with very high stuck-at fault coverages, without any DfT logic.
functional testing
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11562/15485
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