Testability Alternatives Exploration through Functional Testing

Ferrandi, F.; Ferrara, G.; Fornara, G.; Fummi, Franco; Sciuto, D.

doi:10.1109/VTEST.2000.843874

The aim of this paper is to show the effectiveness of a high-level approach to testability analysis and test pattern generation, when analyzing different classes of architectures implementing the same specification. A unique test set is derived on the behavioral specification, based on a functional error model, which shows a high correlation with the single stuck-at-gate-level fault model. Such a test set is then tailored to the particular gate-level implementation by transforming it into a specific test sequence, based on the scheduling adopted by the high-level synthesis. Experimental results show that the application of such test sequences allows one to accurately evaluate the testability of the architecture in terms of gate-level fault coverage, in a fraction of the time required by a gate-level test pattern generator

Titolo:	Testability Alternatives Exploration through Functional Testing
Autori:	F. Ferrandi G. Ferrara G. Fornara FUMMI, Franco D. Sciuto mostra contributor esterni nascondi contributor esterni
Data di pubblicazione:	2000
Abstract:	The aim of this paper is to show the effectiveness of a high-level approach to testability analysis and test pattern generation, when analyzing different classes of architectures implementing the same specification. A unique test set is derived on the behavioral specification, based on a functional error model, which shows a high correlation with the single stuck-at-gate-level fault model. Such a test set is then tailored to the particular gate-level implementation by transforming it into a specific test sequence, based on the scheduling adopted by the high-level synthesis. Experimental results show that the application of such test sequences allows one to accurately evaluate the testability of the architecture in terms of gate-level fault coverage, in a fraction of the time required by a gate-level test pattern generator
Handle:	http://hdl.handle.net/11562/15465
Appare nelle tipologie:	04.01 Contributo in atti di convegno

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