With functional safety being increasingly important in the development of mixed-signal products for automotive applications, EDA solutions have appeared striving to help designers in the setup and execution of fault injection campaigns. Despite the ongoing work to standardize the definition of defect models and coverage calculation methods in the IEEE P2427 draft standard, there is a lack of a unified and portable method to define defect templates that can be used to inject in a systematic way defects in an analog circuit. Each of the existing EDA tool sets for fault injection proposes its own proprietary method to specify how defects should be defined and injected. The proposed paper describes a Verilog-A-based approach to coding defect templates, which through compliance with the Verilog-A standard, warrants portability across compatible simulators. The approach has been validated on the circuits from the Analogue Benchmark Circuits made available by the IEEE P2427 working group.
Verilog-A Implementation of Generic Defect Templates for Analog Fault Injection
Nicola Dall'Ora
;Sadia Azam;Enrico Fraccaroli;Franco Fummi
2023-01-01
Abstract
With functional safety being increasingly important in the development of mixed-signal products for automotive applications, EDA solutions have appeared striving to help designers in the setup and execution of fault injection campaigns. Despite the ongoing work to standardize the definition of defect models and coverage calculation methods in the IEEE P2427 draft standard, there is a lack of a unified and portable method to define defect templates that can be used to inject in a systematic way defects in an analog circuit. Each of the existing EDA tool sets for fault injection proposes its own proprietary method to specify how defects should be defined and injected. The proposed paper describes a Verilog-A-based approach to coding defect templates, which through compliance with the Verilog-A standard, warrants portability across compatible simulators. The approach has been validated on the circuits from the Analogue Benchmark Circuits made available by the IEEE P2427 working group.File | Dimensione | Formato | |
---|---|---|---|
3583781.3590317.pdf
solo utenti autorizzati
Descrizione: Versione dell'editore
Tipologia:
Versione dell'editore
Licenza:
Copyright dell'editore
Dimensione
965.44 kB
Formato
Adobe PDF
|
965.44 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.