AZAM, SADIA
 Distribuzione geografica
Continente #
EU - Europa 212
NA - Nord America 157
AS - Asia 79
AF - Africa 4
SA - Sud America 4
Totale 456
Nazione #
US - Stati Uniti d'America 153
IT - Italia 54
DE - Germania 31
SG - Singapore 29
CN - Cina 28
GB - Regno Unito 24
FI - Finlandia 22
FR - Francia 20
RU - Federazione Russa 20
IE - Irlanda 16
SE - Svezia 13
KR - Corea 5
BR - Brasile 4
ES - Italia 4
TG - Togo 4
CA - Canada 3
IN - India 3
CZ - Repubblica Ceca 2
HK - Hong Kong 2
ID - Indonesia 2
JP - Giappone 2
MY - Malesia 2
PH - Filippine 2
PT - Portogallo 2
TW - Taiwan 2
AE - Emirati Arabi Uniti 1
AT - Austria 1
BE - Belgio 1
CR - Costa Rica 1
LT - Lituania 1
NO - Norvegia 1
PK - Pakistan 1
Totale 456
Città #
Chandler 39
Singapore 25
Helsinki 19
Ashburn 18
Verona 18
Dublin 14
Southend 13
Chions 11
Beijing 7
Los Angeles 6
North Bergen 6
Cagliari 4
Council Bluffs 4
Lomé 4
Roubaix 4
Santa Clara 4
Seattle 4
Seoul 4
Camden 3
Durham 3
Frankfurt am Main 3
Kolkata 3
Lützelbach 3
Milan 3
Munich 3
Shenzhen 3
Upper Marlboro 3
Venice 3
Arzignano 2
Barcelona 2
Brdo 2
Dresden 2
Edinburgh 2
Falkenstein 2
Florence 2
Grenoble 2
Hamburg 2
Hong Kong 2
Hsinchu 2
Jakarta 2
Knoxville 2
Kuala Lumpur 2
Lawrence 2
Lisbon 2
London 2
Luton 2
Manchester 2
Manila 2
Moscow 2
Parma 2
Princeton 2
Sindelfingen 2
Sona 2
Sonora 2
Stolberg 2
Stuttgart 2
Terrassa 2
Toronto 2
Washington 2
Ann Arbor 1
Baoding 1
Boardman 1
Brussels 1
Catanzaro 1
Chicago 1
Des Moines 1
Dubai 1
Gunzenhausen 1
Luoyang 1
Montreal 1
Nakano 1
New Malden 1
Norwalk 1
Nova Lima 1
Nuremberg 1
Owensboro 1
Paris 1
Phoenix 1
Porto Alegre 1
Rozzano 1
San Jose 1
San José 1
Sorocaba 1
Stavanger 1
São Paulo 1
Tianjin 1
Tokyo 1
Trieste 1
Turin 1
Uiwang 1
Vicenza 1
Villach 1
Totale 329
Nome #
Moving Towards Analog Functional Safety 148
A Common Manipulation Framework for Transistor-Level Languages 73
Predictive Fault Grouping based on Faulty AC Matrices 69
Investigation on Realistic Stuck-on/off Defects to Complement IEEE P2427 Draft Standard 68
Functional Level Abstraction and Simulation of Verilog-AMS Piecewise Linear Models 53
Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review 38
Verilog-A Implementation of Generic Defect Templates for Analog Fault Injection 33
Totale 482
Categoria #
all - tutte 2.138
article - articoli 215
book - libri 0
conference - conferenze 1.591
curatela - curatele 0
other - altro 332
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.276


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202110 0 0 0 0 0 0 0 0 0 0 9 1
2021/202236 1 4 0 7 9 2 0 1 0 0 1 11
2022/2023125 9 9 12 14 4 19 4 6 11 4 24 9
2023/2024176 22 18 16 16 19 17 14 18 5 10 11 10
2024/2025135 14 20 18 43 13 13 4 8 2 0 0 0
Totale 482