The diffusion of chromium from thin metallic films into soda-lime and borosilicate glass matrices is investigated by micro-Raman spectroscopy. The process is attained by simple thermal heating of the samples or by field-assisted solid state ion-exchange (FASSIE) at temperatures ranging from 400 to 500 °C. In-depth analyses are performed by means of micro-Raman spectroscopy on sample cross sections. Glass microstructure and network connectivity are studied from the intensity and the positions of the features related to the bending and stretching vibrational modes of the structural units of silica and from the position of the boson peak.

Glass structure modifications induced by diffusion of chromium ions into silicate glasses: An investigation by in-depth profiling Raman micro-spectroscopy

MARIOTTO, Gino;
2013

Abstract

The diffusion of chromium from thin metallic films into soda-lime and borosilicate glass matrices is investigated by micro-Raman spectroscopy. The process is attained by simple thermal heating of the samples or by field-assisted solid state ion-exchange (FASSIE) at temperatures ranging from 400 to 500 °C. In-depth analyses are performed by means of micro-Raman spectroscopy on sample cross sections. Glass microstructure and network connectivity are studied from the intensity and the positions of the features related to the bending and stretching vibrational modes of the structural units of silica and from the position of the boson peak.
Silicate glasses; ion diffusion; structure modifications; Raman micro-spectroscopy; in-depth profiling
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11562/479751
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