We report the observation of strongly anisotropic scattering of laser light at oblique incidence on a (100) oriented porous silicon layer. We performed angle-resolved light scattering measurements and three concentric rings were observed. Modeling this type of porous silicon by means of nanometric columnar air pores and an effective anisotropic uniaxial dielectric constant explains the observed phenomenon, and besides, the angle aperture of these rings allows a direct measurement of birefringence. We finally study the changes of optical anisotropy after different modifications of the structure

Scattering rings as tool for birefringence measurements in porous silicon

Daldosso, Nicola;
2003

Abstract

We report the observation of strongly anisotropic scattering of laser light at oblique incidence on a (100) oriented porous silicon layer. We performed angle-resolved light scattering measurements and three concentric rings were observed. Modeling this type of porous silicon by means of nanometric columnar air pores and an effective anisotropic uniaxial dielectric constant explains the observed phenomenon, and besides, the angle aperture of these rings allows a direct measurement of birefringence. We finally study the changes of optical anisotropy after different modifications of the structure
porous silicon; birefringence; photoluminescence
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11562/478606
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