X-ray absorption fine Spectroscopy has been established as a suitable tool for the determination of the atomica scale structure of nanocrystalline materials. The present work reviews the potentialities and limits of the XAFS techniques when applied to the study of nanocrystalline systems.

The structure of nanocrystalline materials analyzed by X-ray Absorption Fine Structure: the case of porous silicon

Daldosso, Nicola
2000-01-01

Abstract

X-ray absorption fine Spectroscopy has been established as a suitable tool for the determination of the atomica scale structure of nanocrystalline materials. The present work reviews the potentialities and limits of the XAFS techniques when applied to the study of nanocrystalline systems.
2000
XAFS; porous silicon; XEOL
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11562/478385
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact