X-ray absorption fine Spectroscopy has been established as a suitable tool for the determination of the atomica scale structure of nanocrystalline materials. The present work reviews the potentialities and limits of the XAFS techniques when applied to the study of nanocrystalline systems.

The structure of nanocrystalline materials analyzed by X-ray Absorption Fine Structure: the case of porous silicon

Daldosso, Nicola
2000

Abstract

X-ray absorption fine Spectroscopy has been established as a suitable tool for the determination of the atomica scale structure of nanocrystalline materials. The present work reviews the potentialities and limits of the XAFS techniques when applied to the study of nanocrystalline systems.
XAFS; porous silicon; XEOL
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11562/478385
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