Optical properties of directly excited erbium (Er(3+)) ions have been studied in silicon rich silicon oxide materials codoped with Er(3+). The spectral dependence of the direct excitation cross section (sigma(dir)) of the Er(3+) atomic (4)/(15/2) -> (4)/(11/2) transition (around 0.98 mu m) has been measured by time resolved mu-photoluminescence measurements. We have determined that sigma(dir) is 9.0 +/- 1.5 x 10(-21) cm(2) at 983 nm, at least twice larger than the value determined on a stoichiometric SiO(2) matrix. This result, in combination with a measurement of the population of excited Er(3+) as a function of the pumping flux, has allowed quantifying accurately the amount of optically active Er(3+). This concentration is, in the best of the cases, 26% of the total Er population measured by secondary ion mass spectrometry, which means that only this percentage could provide optical gain in an eventual optical amplifier based oil this material.
Optically active Er(3+) ions in SiO(2) codoped with Si nanoclusters
Daldosso, Nicola;
2009-01-01
Abstract
Optical properties of directly excited erbium (Er(3+)) ions have been studied in silicon rich silicon oxide materials codoped with Er(3+). The spectral dependence of the direct excitation cross section (sigma(dir)) of the Er(3+) atomic (4)/(15/2) -> (4)/(11/2) transition (around 0.98 mu m) has been measured by time resolved mu-photoluminescence measurements. We have determined that sigma(dir) is 9.0 +/- 1.5 x 10(-21) cm(2) at 983 nm, at least twice larger than the value determined on a stoichiometric SiO(2) matrix. This result, in combination with a measurement of the population of excited Er(3+) as a function of the pumping flux, has allowed quantifying accurately the amount of optically active Er(3+). This concentration is, in the best of the cases, 26% of the total Er population measured by secondary ion mass spectrometry, which means that only this percentage could provide optical gain in an eventual optical amplifier based oil this material.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.