The local structure of porous silicon has been studied exciting its optical luminescence by X-rays (XEOL). The photoluminescence yield and the total electron yield (TEY), recorded simultaneously as a function of the X-ray energy at the Si K edge, give rise to the extended X-ray absorption fine structures (EXAFS). Analysis of EXAFS data confirms that the optical luminescence of porous Si originates from the nanocrystalline cores and shows that XEOL-EXAFS and TEY-EXAFS are sensitive to different Si local environment. It can be assumed that XEOL-EXAFS is related only to the light emitting sites while TEY-EXAFS is sampling both luminescent and non-luminescent Si sites.
Local order in light emitting porous silicon studied by XEOL and TEY
Daldosso, Nicola;
1998-01-01
Abstract
The local structure of porous silicon has been studied exciting its optical luminescence by X-rays (XEOL). The photoluminescence yield and the total electron yield (TEY), recorded simultaneously as a function of the X-ray energy at the Si K edge, give rise to the extended X-ray absorption fine structures (EXAFS). Analysis of EXAFS data confirms that the optical luminescence of porous Si originates from the nanocrystalline cores and shows that XEOL-EXAFS and TEY-EXAFS are sensitive to different Si local environment. It can be assumed that XEOL-EXAFS is related only to the light emitting sites while TEY-EXAFS is sampling both luminescent and non-luminescent Si sites.
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