A functional automatic test pattern generator (ATPG) that explores the design under test (DUT) state space by exploiting an easy-to-traverse extended finite state machine (FSM) model has been described. The ATPG engine relies on learning, backjumping and constraint logic program- ming to deterministically generate test vectors for traversing all transitions of the extended FSM. Testing of hard-to-detect faults is thus improved. The generated test sequences are very effective in detecting both high-level faults and gate-level stuck-at faults. Thus, the reuse of test sequences gen- erated by the proposed ATPG allows also to improve the stuck-at fault coverage and to reduce the execution time of commercial gate-level ATPGs.
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